Crystallographic texture is the statistical distribution of crystal orientations in a specimen. MTEX reaches that distribution from two main kinds of measurement: orientation maps and diffraction pole figures.
Each tutorial below follows one short, reproducible analysis from data import to an interpreted result. Open a tutorial in the MATLAB editor, run it section by section, and change one choice at a time.
edit EBSDTutorial;A tutorial is a worked route, not a measurement protocol. Parameters such as reconstruction thresholds and smoothing widths depend on the specimen and the scientific question. The linked chapters explain those choices.
Before you start
General Concepts introduces the MTEX object model. One variable usually holds a vectorized list of measurements or grains, and selecting a subset is how an analysis narrows its question.
Notation and Conventions states MTEX's choices for angles, Euler angles, and the direction of an orientation. It distinguishes planes from directions and covers crystal-axis alignment, plotting conventions, units, and the names used in examples.
Before the diffraction route, read Miller Indices and Specimen Symmetry. They introduce Miller indices and the specimen invariance used in pole-figure reconstruction.
Choose the route that matches your measurement
Electron backscatter diffraction (EBSD) records a phase and an orientation at each sampled position on a polished surface. The resulting orientation map retains spatial information: it says what was measured and where it was measured.
Start with EBSD, which imports and audits a map. It plots phase and orientation maps, reconstructs grains, and plots pole figures and inverse pole figures. Continue with Grains to compare pixel and grain orientations. It selects and measures grains and previews boundaries between phases. Then use Grain Boundaries to analyse their interfaces.
Before importing your own map, read Reference Frame. A reference frame is the coordinate system in which the data are expressed. It is distinct from crystal symmetry and from the plotting convention that lays the frame out on screen.
X-ray and neutron diffraction measure many crystals together. For one selected lattice plane, a pole figure records intensity over specimen directions. It describes an illuminated volume but does not retain the spatial position of each contributing crystal.
Start with Pole Figure Data, which imports and corrects measured pole figures. It reconstructs an ODF and checks it against the measurements. Continue with ODFs for ODFs estimated from orientations and for model ODFs.
Where the two routes meet
An orientation distribution function (ODF) is a continuous density over crystal orientations. It can be estimated from individual EBSD orientations or reconstructed from diffraction pole figures.
The ODF is therefore a common representation for texture from either route. An EBSD orientation list can also be projected directly into pole figures when that is the comparison the experiment requires. Continue with ODFs from either route. It estimates an ODF from individual EBSD orientations, reconstructs one from pole figures, and defines a model ODF.
VPSC starts from a third kind of input: simulated texture from the visco-plastic self-consistent deformation code. It is intended for readers who already have modelling output rather than measurements.
Continue into the chapters
The worked EBSD route leads into EBSD, Grains, and Grain Boundaries. The diffraction route leads into Pole Figures, and both routes meet again in ODF.
The objects used throughout these chapters begin with Vectors and Crystal Geometry. Return to those foundations when directions, rotations, orientations, or symmetry become the subject rather than merely an input.
Further reading
- O. Engler, S. Zaefferer and V. Randle, Introduction to Texture Analysis: Macrotexture, Microtexture, and Orientation Mapping, 3rd ed., CRC Press, 2024, connects diffraction measurements with orientation microscopy.
- H.-J. Bunge, Texture Analysis in Materials Science: Mathematical Methods, Butterworths, English ed., 1982, develops the classical pole-figure and ODF theory.
- ASTM E81-96(2024) covers X-ray acquisition of quantitative pole figures.
- ISO 13067:2020 specifies EBSD procedures for measuring average grain size on two-dimensional sections.
Citing this page.
This page is part of the documentation of
MTEX, a free and open
source MATLAB toolbox for analyzing and modeling crystallographic textures.
It was written by The MTEX Developers and is published at
https://mtex-toolbox.github.io/Tutorials.html.
If you use MTEX, or reuse text or figures from this page, in your research,
please cite
F. Bachmann, R. Hielscher, H. Schaeben: Texture Analysis with MTEX - Free and Open Source Software Toolbox, Solid State Phenomena 160 (2010), 63-68. 10.4028/www.scientific.net/SSP.160.63
BibTeX
@article{bachmann2010mtex,
author = {F. Bachmann and R. Hielscher and H. Schaeben},
title = {Texture Analysis with MTEX - Free and Open Source Software Toolbox},
journal = {Solid State Phenomena},
volume = {160},
pages = {63-68},
year = {2010},
doi = {10.4028/www.scientific.net/SSP.160.63},
url = {https://doi.org/10.4028/www.scientific.net/SSP.160.63}
}
Other papers describing specific MTEX methods are listed under Publications — please cite the one that best fits your application. The MTEX source code is licensed under the GNU General Public License v2.0; the text and figures of this documentation are licensed under CC BY 4.0, which permits reuse — including by automated systems — provided The MTEX Developers and this page are credited.